Jesper Wallentin
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- 2020
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Mark
Direct Three-Dimensional Imaging of an X-ray Nanofocus Using a Single 60 nm Diameter Nanowire Device
- Contribution to journal › Article
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Mark
In Situ Imaging of Ferroelastic Domain Dynamics in CsPbBr3Perovskite Nanowires by Nanofocused Scanning X-ray Diffraction
- Contribution to journal › Article
-
Mark
Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction
- Contribution to journal › Article
- 2019
-
Mark
Nanoscale mapping of carrier collection in single nanowire solar cells using X-ray beam induced current
(2019) In Journal of Synchrotron Radiation
- Contribution to journal › Article
-
Mark
Simultaneous Growth of Pure Wurtzite and Zinc Blende Nanowires
- Contribution to journal › Article
-
Mark
Characterization of Nanowire Devices Using Nano-Focused X-Ray Beams
(2019) 2019 Compound Semiconductor Week, CSW 2019
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline
- Contribution to journal › Article
- 2018
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Mark
Spectrally resolved x-ray beam induced current in a single InGaP nanowire
- Contribution to journal › Article
-
Mark
Nanobeam X-ray Fluorescence Dopant Mapping Reveals Dynamics of in Situ Zn-Doping in Nanowires
- Contribution to journal › Article
- 2017
-
Mark
Simulated sample heating from a nanofocused X-ray beam
- Contribution to journal › Article
