Electromagnetics and Nanoelectronics
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- 2025
-
Mark
Low-frequency noise in ferroelectric III-V vertical gate-all-around FETs
2025) In IEEE Electron Device Letters(
- Contribution to journal › Article
-
Mark
Sum rules and physical bounds for a particulate slab
2025) p.253-280(
- Chapter in Book/Report/Conference proceeding › Book chapter
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Mark
Degrees of Freedom for Radiating Systems
(
- Contribution to journal › Article
-
Mark
Stabilized scattering matrix formulation for 2D periodic multilayer dielectrics
2025) In Technical report(
- Book/Report › Report
-
Mark
Prospects of analog in-memory computing using ferroelectric tunnel junctions
(
- Contribution to journal › Article
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Mark
Theory and Computation of Substructure Characteristic Modes
(
- Contribution to journal › Article
-
Mark
Performance Limits for Microstrip Patch Antennas
2025)(
- Thesis › Doctoral thesis (compilation)
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Mark
Gate Layout and Process Reliability Co-Optimization in High-Speed Vertical III–V Nanowire Metal-Oxide-Semiconductor Field-Effect Transistor Technology
2025) In Physica Status Solidi (A) Applications and Materials Science(
- Contribution to journal › Article
-
Mark
Interface Characterization of Plasma-Treated InAs Electrodes for Resistive Random-Access Memories Using Capacitance–Voltage Methods
2025) In Physica Status Solidi (A) Applications and Materials Science(
- Contribution to journal › Article
- 2024
-
Mark
Characterization of emerging non-volatile cryogenic memories
2024)(
- Thesis › Master's thesis