Electromagnetics and Nanoelectronics
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- 2025
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Mark
Interface Characterization of Plasma-Treated InAs Electrodes for Resistive Random-Access Memories Using Capacitance–Voltage Methods
- Contribution to journal › Article
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Mark
Impact of Layout on the RF Performance of Vertical In–Ga–As Nanowire MOSFETs
- Contribution to journal › Article
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Mark
Scalable Vertical In-Ga-As Nanowire MOSFET With 67 mV/dec at 126μm Gate Width
- Contribution to journal › Article
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Mark
Microwave Reconstruction of Fabrication Defects in Known Objects Using Scattering Parameter Sensitivities
(2025) 19th European Conference on Antennas and Propagation, EuCAP 2025 In EuCAP 2025 - 19th European Conference on Antennas and Propagation
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Low-frequency noise in ferroelectric III-V vertical gate-all-around FETs
(2025) In IEEE Electron Device Letters
- Contribution to journal › Article
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Mark
Cryogenic ferroelectricity of HZO with an aluminum oxide interlayer
(2025) In IEEE Transactions on Electron Devices
- Contribution to journal › Article
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Mark
Weiglhofer Symposium Panel Discussion : Future Developments
(2025) p.421-422
- Chapter in Book/Report/Conference proceeding › Book chapter
- 2024
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Mark
Ferroelectricity in ultrathin HfO2-based films by nanosecond laser annealing
- Contribution to journal › Article
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Mark
Cryogenic Ferroelectricity of HZO Capacitors on a III-V Semiconductor
- Contribution to journal › Article
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Mark
Cryogenic Evaluation of Resistive Random Access Memory With Enhanced Endurance at 14 K
(2024) In IEEE Transactions on Electron Devices
- Contribution to journal › Article
