Nano Electronics
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- 2023
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Mark
Electrically active defects in Al2O3-InGaAs MOS stacks at cryogenic temperatures
(2023) 2023 IEEE International Integrated Reliability Workshop, IIRW 2023 In IEEE International Integrated Reliability Workshop Final Report
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Dynamics of Polarization Switching in Mixed Phase Ferroelectric-Antiferroelectric HZO Thin Films
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
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Mark
Artificial nanophotonic neuron with internal memory for biologically inspired and reservoir network computing
- Contribution to journal › Article
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Mark
Geometrical Magnetoresistance as a Tool for Carrier Mobility Extraction in InGaAs MOSFETs
- Contribution to journal › Article
-
Mark
Vertical III-V nanowire tunnel field-effect transistors : a circuit perspective
(2023) In Series of licentiate and doctoral theses
- Thesis › Doctoral thesis (compilation)
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Mark
High-k/InGaAs interface defects at cryogenic temperature
- Contribution to journal › Article
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Mark
gm/Id Analysis of vertical nanowire III–V TFETs
- Contribution to journal › Article
- 2022
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Mark
A 5.8-GHz Rectifier Using Diode-Connected MESFET for Space Solar Power Satellite System
- Contribution to journal › Article
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Mark
Low-Temperature Characteristics of Nanowire Network Demultiplexer for Qubit Biasing
- Contribution to journal › Article
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Mark
Improved Endurance of Ferroelectric HfxZr1–xO2 Integrated on InAs Using Millisecond Annealing
- Contribution to journal › Article
